IL / RL / PDL
Transmission and polarization
Evaluate insertion loss, return loss and polarization-dependent loss for component characterization and channel comparison.
OPTICAL VECTOR EXPLORER
OVX
Optical Vector Analyzer Platform
Measure optical loss, reflection locations, polarization characteristics and optical power spectra on one platform.
Built around a tunable laser source (TSL) and coherent optical measurement, the platform connects swept-wavelength operation, component analysis and multichannel testing. Depending on configuration, OSA functions analyze optical power versus wavelength, spectral peaks and spectral bandwidth for optical communications and silicon photonics R&D.
Supported spectrum types, resolution and available OSA functions are subject to the confirmed configuration.
IL / RL / PDLOptical path quality and polarization measurements
Coherent Optical MeasurementSpatial reflection analysis and fault localization
O + CPulse / Pro* Dual-band configurations
1 / 32 / 64 chModel-dependent channel configurations
01 / MEASUREMENT
Understand the Key Characteristics of Your Optical Path
From end-to-end loss to spatial distributions, build multidimensional measurement results for the same device under test in the same state.
Coherent Optical Measurement
Reflection and spatial diagnostics
Use reflection distributions along the optical path to locate anomalies and investigate connectors, coupling interfaces and waveguides.
OSA / λ
Spectral and wavelength analysis
Combine spectral analysis and wavelength measurement capabilities to provide data for optical power spectrum analysis and wavelength verification.
MEMS 1:N
Automated multichannel scanning
Use a MEMS optical switch to connect multiple channels for sequential scanning and analysis, reducing manual switching.
TSL / TUNABLE LASER
Tunable Laser Source (TSL)
A Controlled Source for Every Sweep
Wide tuning range, wavelength accuracy and narrow linewidth provide a controlled source for spectral characterization and coherent measurements.
110 nm*
1500–1610 nm tuning range
Adjustable sweep speed: 0–1000 nm/s
±0.2 pm*
Absolute wavelength accuracy
Wavelength repeatability: ±0.05 pm
≤100 kHz*
Laser linewidth
Side-mode suppression ratio: ≥50 dB
±0.1 pm / 24 h*
24-hour wavelength stability
Output power: ≥10 mW
* The values shown refer to a 1500–1610 nm source configuration covering the C band. Applicable operating modes and test conditions for accuracy, repeatability, linewidth, stability and power must be confirmed for the selected model.
The O band is a separate configuration option; its tuning range and performance specifications require separate confirmation. This does not indicate continuous tuning from the O band to the C band or a common source configuration across all OVX models.
View Full Source Specifications
- Sweep linearity
- ≥99%
- Power stability
- ≤1%
- Rated power consumption
- <30 W
See the scope note above. Confirm scan mode, speed, environmental conditions and delivered specifications during configuration.
Applications are grouped by device under test and test objective. The TSL provides a controlled optical source; detection, polarization and motion control are selected for the task.
Optical communications
Verify transmission characteristics of WDM components
For packaged filters, multiplexers and demultiplexers, combine a tunable source with power detection and a reference path to measure insertion loss, passbands and channel isolation for component selection, incoming inspection and production testing.
Silicon photonic integration
Establish device-level baselines for PIC design and fabrication
For waveguide, microring and interferometer test structures on wafers and bare dies, use optical coupling and detection to record transmission spectra and extract resonance wavelengths, free spectral range and extinction ratio for design verification, process comparison and die screening.
Photonic computing and quantum photonics
Set the optical input for programmable circuits and photonics experiments
For programmable interferometer networks and photonics experiments, provide a wavelength-selectable input and combine external modulation, control and detection for classical optical circuit calibration and parameter sweeps. Coherence, phase noise and wavelength compatibility must be confirmed for the experiment; single-photon generation and quantum-state measurements require additional dedicated systems.
02 / PRODUCT SERIES
From Single-Channel Verification to Multichannel Testing
Select an OVX configuration based on wavelength band, channel count and analysis requirements.
Selected configuration
Discuss the Pulse Configuration ↗KH-OVX-Pulse*
32-channel O+C-band configuration for multichannel component analysis and automated test workflows.
| Parameter | Trace mini | Standard | Pulse* | Pro* |
|---|---|---|---|---|
| Channels | 1 | 1 (expandable to 16 / 32) | 32 | 64 |
| Wavelength band | C-band | C-band | O+C bands | O+C bands |
| RL dynamic range | ≥70 dB | ≥85 dB | ≥85 dB | ≥110 dB（EDFA） |
| Spatial resolution | ≤100 μm | ≤12 μm | ≤8 μm（C-band） | ≤8 μm（C-band） |
| OSA resolution | — | 0.08 nm | 0.08 nm | 0.048 nm |
| Wavelength meter accuracy | — | ±0.3 pm | ±0.2 pm | ±0.2 pm |
* Pulse and Pro are unreleased series. Listed specifications are preliminary; final configurations, features and availability are subject to formally released technical documentation.
These are proposed series specifications. Capabilities and test conditions are subject to the configuration and technical specification agreed by both parties. Product images illustrate the platform appearance, not the complete hardware configuration of each model.
PORTABLE / TRACE MINI
Trace mini
Bring Optical Link Measurements into the Field
KH-OVX-Trace mini · Portable optical link tester
A compact, single-channel C-band instrument configuration for optical link interferometric measurements and anomaly localization.
- Channel
- 1
- RL dynamic range
- ≥70 dB
- Spatial resolution
- ≤100 μm
Parameters come from the product series plan; test conditions are subject to the agreed technical specification. TM-600 is the appearance nameplate shown in the image.
03 / APPLICATIONS
Connect R&D and Manufacturing Test
Organize optical testing around four test insertions for CPO and silicon photonic devices.
PIC wafer screening
Evaluate waveguide IL, RL and PDL before bonding to help identify optical anomalies.
Focus: optical quality screeningBonding and coupling analysis
Use reflection information from coherent optical measurements to investigate post-bond optical path integrity and support coupling-alignment verification.
Focus: connectivity and alignmentMultiparameter optical engine testing
Combine loss, polarization, wavelength and spectral analysis for optical engines and multichannel components.
Focus: channel-to-channel consistencyFinal-product and reliability verification
Verify optical parameters in finished modules and retain records for outgoing quality assessment and reliability analysis.
Focus: results and traceabilityTypical Devices Under TestSilicon photonic integrated circuits (PICs)CPO optical enginesXPO modulesAOCs / optical transceivers
04 / PLATFORM
One Measurement Platform,
Multiple Test Tasks
Coherent optical swept measurements connect to MEMS multichannel scanning, followed by software analysis, to form an integrated test workflow.
- 01Coherent optical swept measurementsAcquire optical reflection and transmission information
- 02MEMS 1:N sequential scanningConnect to DUT channels one at a time
- 03Scan analysis and result evaluationParameter analysis, anomaly localization and pass/fail assessment
DESIGNED FOR DAILY OPERATION
Touchscreen Analysis Meets Physical Controls
- Dual-view traces
- Zoom, position cursors and analyze results within the active view.
- CURSOR knob and directional ring
- Press to select a cursor type, rotate for fine adjustment and use direction keys for positioning.
- Dedicated acquisition and save keys
- START / STOP controls acquisition; SAVE RESULT saves screenshots and measurement data together.
- Numeric keypad
- Enter numeric values in on-screen fields for workflows that require frequent parameter adjustments.
Expand Around Your Test System
Channel expansion, optical interfaces and automation data integration can be discussed per project. Platform plans describe MEMS expansion toward 1–128 channels; actual channel counts, cycle time and protocols require DUT-specific confirmation.
SOFTWARE
Measurement, Application Distribution and Technical Service
Efficient, simple, modular, platform-based and standardized—reducing the learning curve for seamless transitions and productive measurements.
Web GUI × SCPI
One Measurement Language for Interaction and Automation.
Reduce operating effort with intuitive interfaces and connect test workflows through standardized control. Consistent configuration, measurement, analysis and records support modular expansion and workflow reuse. Interface availability and compatibility depend on the product version.
MEASURE & ANALYZE
OVX-Studio
Measurement and analysis workspace
Clear Measurements. Reviewable Results.
- Single / dual views and multitrace comparison
- Consistent single and continuous measurement workflows
- Records linked to configuration, calibration and algorithm versions
- Coordinated Recipe management across production instruments
DISTRIBUTE & MANAGE
OVX-StoreX
Application and version management platform
Controlled Updates. Modular Capabilities.
- Unified management of software, algorithms and drivers
- Compatibility checks, test readiness and release review
- Online / offline distribution
- Licensing and rollback management
SERVICE & TRACE
OVX-Sever
Technical service and issue-tracking platform
01 Tickets and field records02 Defects and corrective releases03 Verification records and knowledge capture
Documented Issues. Traceable Resolution.
- Tickets linked to logs and field screenshots
- Defects linked to corrective versions and verification records
- Reusable service knowledge to reduce repeated communication
Interfaces illustrate product concepts. Available functions, supported instruments and licensing depend on the delivered version.
05 / SELECTION GUIDE
Before Choosing a Configuration
How should I choose between Standard, Pulse and Pro?
First confirm the DUT wavelength bands and ports. Standard is a starting point for single-channel C-band tasks; Pulse corresponds to the proposed 32-channel O+C-band configuration; Pro addresses 64 channels or higher RL dynamic range, subject to EDFA configuration and test-condition confirmation.
Does multichannel mean all channels are acquired simultaneously?
The documented architecture uses MEMS 1:N sequential scanning, switching between channels in turn. Actual cycle time depends on scan settings, channel count and analysis tasks, and must be verified with representative samples.
Can the platform connect to an existing automated test system?
Electro-optical testing and automation integration can be discussed for specific projects. Please provide the system architecture, data formats and protocols; supported functionality is defined in the project scope.
How can I request technical information or sample testing?
Provide the DUT type, key parameters, wavelength bands and channel count so our technical team can assess the configuration, documentation and sample-verification arrangements.