From Components to Optical Interconnects.
Evidence for Every Test Question.

Start with the task—connect spectral characterization, optical path diagnostics and multichannel verification.

For optical communications, silicon photonics and emerging photonic applications, relate measured parameters to engineering problems and provide traceable evidence for R&D, process optimization and quality assessment.

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Wafer surface and chip array illustrating the application area
From individual structures to complex optical paths. Application illustration.

What Does Your DUT
Need to Tell You?

Filter by application area or start with a specific test task. Each solution explains why the parameters matter, then defines the measurement method and configuration boundaries.

6 test tasks

Not Isolated Parameters.
Connected Engineering Decisions.

DUTs and stations change; measurement conditions, references and records must remain clear.

  1. 01 / DESIGN

    R&D verification

    Compare spectral and transmission responses to understand differences between design and measurement.

  2. 02 / ASSEMBLY

    Coupling and packaging

    Observe changes before and after coupling and assembly to narrow the investigation.

  3. 03 / INTEGRATION

    Multichannel verification

    Associate results with actual paths and compare channel performance.

  4. 04 / QUALITY

    Quality assessment

    Apply agreed methods and thresholds, retaining evidence for review.

Observe the Response.
Investigate the Location.

Spectral information reveals wavelength-dependent behavior; coherent optical measurement spatial information provides location clues for reflections and optical anomalies. Link conditions, device structures and results to support engineering decisions.

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01 / SPECTRAL

Spectral response and transmission

Assess device performance through wavelength response, loss and polarization-dependent differences.

02 / SPATIAL

Spatial diagnostics

Investigate where an issue may occur using event locations and structural information.

03 / CONTEXT

Conditions and evidence

Retain reference planes, paths, configurations and versions to give comparisons and retests context.

Integrated Measurements.
Flexible Combinations.

OVX includes a built-in TSL. Standalone TSLs serve user-built systems. External optical controls and basic instruments are selected per task and are not all standard OVX equipment.

OVX Series

An integrated optical measurement and analysis platform with a built-in TSL.

Trace mini / Standard / Pulse* / Pro*

Standalone TSL and optical path control

Tunable sources, channel switching and polarization control for user-built systems.

OVX-TLS / OVX-SW / OVX-PC

Spectral and polarization analysis

Add independent spectral, state-of-polarization and PDL analysis as required.

OVX-OSA / OVX-PA / OVX-PDL

* Pulse and Pro are unreleased series. Listed specifications are preliminary; final configurations, features and availability are subject to formally released technical documentation.
These standalone-instrument series identifiers are provisional names from the product-family plan. Models, interfaces, functions and delivery status are subject to confirmed technical documentation. Sequential optical switching is not simultaneous multichannel acquisition.

Reduce the Learning Curve.
Build on Measurement Experience.

Efficient, simple, modular, platform-based and standardized. Web GUI, SCPI and a unified Measurement API are design principles for consistent measurement semantics across interaction and automation.

OVX-Studio organizes measurement and analysis; OVX-StoreX manages applications and versions; the service platform links field records and issue resolution. Availability depends on the product version.

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