MEASURE
Super-resolution optical frequency-domain interferometry
Resolve reflection, loss, defects and polarization-related information along optical paths to establish trustworthy measurement data.
KEYHOLE PHOTONICS · SILICON PHOTONICS TEST
Master the Spectrum
Measure at Scale
We use super-resolution optical frequency-domain interferometry to investigate light propagation in communication links, and digital twins to relate structure to performance. Our goal is to provide traceable measurement evidence for R&D, process optimization and production quality assessment in high-speed optical communications, silicon photonics and photonic quantum computing.
OUR MISSION
Advance optical testing through optical digital twins, making silicon photonic chip quality measurable.
Keyhole Photonics focuses on silicon photonic chip testing across optical communications, silicon photonics, and photonic computing and quantum photonics.
Our approach combines super-resolution optical frequency-domain interferometry with optical digital twins to measure reflection and loss along optical paths, locate anomalies, and relate device structure to performance—helping engineers determine where a problem occurs and which process steps warrant investigation.
Meet Keyhole Photonics ↗PrecisionPrecision is fundamental to an instrument
ReliabilityTrustworthy data is essential
Shared ProgressContinuous innovation and service for customers and the industry
FLAGSHIP PLATFORM
OVX Series
An optical vector analyzer platform for silicon photonic chips and optical components, bringing high-resolution reflection, loss analysis and fault localization to R&D, process development and production.
- Super-resolution optical frequency-domain interferometry for optical loss analysis and fault localization
- Diagnostics for waveguides, coupling interfaces and packaged optical paths
- StoreX / Server extensions for plug-in licensing and updates, service tickets and calibration reminders*
* Some extension capabilities are still under development or validation. Availability, licensing and delivery schedules are subject to the agreed software version and technical documentation.
Explore the Product Platform
TECHNOLOGY ROADMAP
Trace Light to Its Source
Analyze optical paths with super-resolution optical frequency-domain interferometry and relate structure to performance through optical digital twins—progressively connecting measurement, diagnostics, traceability and automated testing.
DIAGNOSE
Relating structure to performance
Connect waveguide, coupling and packaging information with device performance to narrow the fault-localization process.
OPTICAL DIGITAL TWIN
Optical digital twins
Build traceable test datasets to support process-window analysis and quality assessment.
SCALE
Production and ecosystem integration
Planned integration with automation, MES and yield analysis to connect R&D and production data.
THREE APPLICATION AREAS
One technology foundation for today's industry and tomorrow's applications.
Our roadmap builds on optical communications, advances silicon photonics, and explores measurement limits in photonic computing and quantum photonics.
01
Optical Links
Supporting yield improvement in high-speed photonic chips
Mature · Stable · Production-focused02Silicon photonics
A measurement benchmark for silicon photonic integration
Precision · Integration · Local supply-chain capability03Photonic computing and quantum photonics
Measurement infrastructure for emerging photonic chips
Emerging · Advanced · Future-facingINSIGHTS
Light travels farther.
And moves closer to the chip.
From low-loss fiber to chip-to-chip optical interconnects, follow how optical testing challenges evolve.
Follow the timeline · Milestones are illustrative; spacing is not proportional to elapsed time
- 1966
Using light to carry information
Charles Kao and George Hockham propose a theoretical path toward fiber-optic communications.
Historical source ↗ - 1970
Breaking the loss barrier
Corning develops low-loss optical fiber, helping make fiber-optic communications practical.
Historical source ↗ - 2016
The AlphaGo milestone
AlphaGo defeats Lee Sedol 4–1, marking a milestone in AI capabilities.
Historical source ↗ - 2022
The ChatGPT milestone
On November 30, ChatGPT launches as a research preview, giving the public direct access to generative AI.
Launch announcement ↗ - NEXT / TODAY'S DEVELOPMENTS
Moving between chips
Silicon photonics and CPO/NPO bring denser optical paths—and demand more detailed measurements.
Keyhole's testing perspectiveNVIDIA Next-Generation CPO Platform ↗Spectrum-X Ethernet Photonics · 2026.01.05
Keep Exploring
Components and Characterization
Why Does Changing Polarization Change the Measured Result?
The device and wavelength stay the same, yet reconnecting the fiber produces a different transmission result. Understanding polarization helps distinguish device response from input conditions and coupling changes.
Read Insight ↗ Interconnects and ManufacturingMore Channels: Why Sweep Speed Is Not the Only Test Bottleneck
Moving from a single path to FAUs, MPOs and multichannel optical engines requires more than fast acquisition. Mapping, switching stability, reference management and anomaly retesting determine whether the results are usable.
Read Insight ↗ Software and WorkflowsWhy Remote Commands Alone Do Not Make Measurement Automation
A successful remote connection only establishes a control path. A repeatable workflow also needs state synchronization, condition records, exception recovery and version management.
Read Insight ↗ Emerging Applications and R&DWhy Photonic Computing and Quantum Experiments Need Classical Optical Characterization
Programmable optical circuits depend on interference, phase and path control. Without understanding loss, drift and input conditions, changes in outputs or counts cannot readily be attributed to computation or quantum processes.
Read Insight ↗ Industry TrendsWhat Does Growing Compute Demand Mean for Optical Interconnect Testing?
Growing compute demand requires faster links and stable connections across more channels under power, space and manufacturing-cost constraints. These constraints explain why optical architectures and test requirements evolve together.
Read Insight ↗ Manufacturing and TestAs Optics Moves Closer to the Chip, Why Must Testing Move Upstream?
As chips, optical coupling and packaging become more integrated, discovering a problem only at final test can lengthen the investigation. Moving testing upstream means obtaining useful evidence at the right stage—not simply testing earlier.
Read Insight ↗ Test MethodsPoor Wafer-Test Results: Is It the Chip or the Coupling?
Low power, drifting traces or inconsistent repeat measurements do not necessarily originate in the chip. Verify measurement-path stability and reference conditions before separating coupling changes from device differences.
Read Insight ↗ Optical Path DiagnosticsTotal Loss Shows How Much—How Can You Determine Where?
An end-to-end reading assesses overall transmission but does not directly locate an anomaly. Combining transmission results, spatial information and controlled retesting helps narrow the investigation to a structure or interface.
Read Insight ↗OUR VISION
To become a leader in silicon photonics test instrumentation.
Focused on instrumentation and sustained development, we aim to extend the precision and practical value of photonic chip testing across optical communications, silicon photonics, photonic computing and quantum photonics.
Help Shape the Next Standard